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Test conditions

 

Conditions under which a vision chip is tested are very important. A mere statement of ``room condition'' or ``under sun light'' does not represent an engineering method of testing. More quantified measures are required.

The main function of vision chips is to acquire and process light intensity in space and/or time. Therefore, a measure of the lighting conditions should be provided at the first instance. Some simple tests and measures for this purpose are described here.

There are instruments available for measuring each of the above tests. For many light sources, the manufacturers may provide basic data, such as spectrum and spatial distribution patterns. For almost all optical interfaces the manufacturers provide extensive data.

Another test condition of great importance is the biasing conditions of the chip. Vision chips usually have several biasing parameters to tune the functionality of the chip. Obviously, a chip may not function under all conditions, and tuning might be required for different tests. If the tuning (or adaptation) is a builtin or automated function, it does not need to be expressed in test conditions. However, if manual tuning should be performed to adjust the chip for different tests, it should be left at the ``best biasing conditions'' for all tests. This limitation is to simulate the operation of the chip if it is used for a real application, or in other words, the reliability and total dynamic range of the chip.


next up previous contents
Next: Steady-state tests Up: Testing vision chips Previous: Tests and Measurements

Alireza Moini,
Centre for High Performance Integrated Technologies and Systems (CHIPTEC),
Adelaide, SA 5005,
March 1997