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Spatio-temporal tests

 

Spatio-temporal tests involve another dimension for testing. Adding the temporal dimension to the tests is relatively simple. In fact by moving any of the patterns used for testing the steady-state functioning of vision chips in front of the chip under test, spatio-temporal responses can be obtained and measured. Step inputs are the most common stimuli applied to vision chips. The bar patterns can easily perform this test without the need for a special setup.

For some special vision chips, or for quantitative characterization of the chip, special test setups may be necessary (For example see [Meitzler 96, McQuirk 96b]).

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next up previous contents
Next: Other resources Up: Testing vision chips Previous: Steady-state tests

Alireza Moini,
Centre for High Performance Integrated Technologies and Systems (CHIPTEC),
Adelaide, SA 5005,
March 1997